By Peter W. Hawkes
Advances in Imaging & Electron Physics merges long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence beneficial properties prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, picture technology and electronic snapshot processing, electromagnetic wave propagation, electron microscopy, and the computing tools utilized in some of these domains.
- Contributions from major experts
- Informs and updates on all of the most modern advancements within the field
Read or Download Advances in Imaging and Electron Physics, Volume 183 PDF
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Additional resources for Advances in Imaging and Electron Physics, Volume 183
Also, there is the idea of coupling the S-LIP model with the wavelet concept to analyze digital images, the S-LIP model acting in the spatial plane (rows and columns of pixels) and the wavelets on the brightness of each pixel. In section 2 of this chapter, the general concepts of wavelet and wavelet transform are presented in the continuous and discrete versions, in the 1-D (signal) and 2-D (image) cases, in a synthetic form useful for the understanding of the new concept of logarithmic wavelets.
1993). Transmission of electrons through ferromagnetic material and applications to detection of electron spin polarization. Annals of Physics (Leipzig), 505, 465–474. Sealy, C. , Castell, M. , & Wilshaw, P. R. (2000). Mechanism for secondary electron dopant contrast in the SEM, Journal of Electron Microscopy, 49, 311–321. Sickafus, E. N. (1971). A secondary emission analog for improved auger spectroscopy with retarding potential analyzers. Review of Scientiﬁc Instruments, 42, 933–941. Siegmann, H.
Thornley, R. F. M. (1960). Wide-band detector for micro-microampere low-energy electron currents. Journal of Scientiﬁc Instruments, 37, 246–248. Fernandez-Varea, J. , & Salvat, F. (2005). Cross sections for electron interactions in condensed matter. Surface and Interface Analysis, 37, 824–832. , & Ikeno, S. (2007). Cathode lens mode of the SEM in materials science applications. Materials Transactions, 48, 944–948. 38 Mohamed M. El-Gomati and Christopher G. H. Walker Furman, M. , & Pivi, M.