Download Advances in Imaging and Electron Physics, Vol. 107 by Peter W. Hawkes (Ed.) PDF

By Peter W. Hawkes (Ed.)

Advances in Imaging & Electron Physics merges long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy . The sequence good points prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technology and electronic photograph processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in a majority of these domain names.

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Extra info for Advances in Imaging and Electron Physics, Vol. 107

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In both cases, the traces were obtained by subtracting a smoothed polynomial fit from the raw rnagneto-conductance data. The form of the background did not change significantly over the temperature range shown, and its average resistance was of order 16 kR. scattering in the point contact leads. To compute the characteristic magnetic flux enclosed between these orbits, we consider the area that a single orbit encloses as it skips coherently along the walls of the dot (Fig. , 1995) where N is the number of bounces the electron makes before losing phase coherence and vQ is the Fermi velocity.

K. FERRY, AND M. 5 MAGNETIC FIELD (TESLA) FIGURE23. 75 ez/h for clarity). In both cases, the traces were obtained by subtracting a smoothed polynomial fit from the raw rnagneto-conductance data. The form of the background did not change significantly over the temperature range shown, and its average resistance was of order 16 kR. scattering in the point contact leads. To compute the characteristic magnetic flux enclosed between these orbits, we consider the area that a single orbit encloses as it skips coherently along the walls of the dot (Fig.

Lower figure: Corresponding magneto-resistance lineshape, obtained by averaging over all curves in the upper right plot. different peak lineshapes by averaging over different regions of the same dot spectrum. , 1994), we instead suggest it arises as the effective window over which averaging is performed increases at higher temperatures. Indeed, an important question, which we have thus far neglected to consider, concerns our choice of energy window in the simulations. In experiment, the two main sources of energy averaging are thought to be thermal smearing and lifetime broadening (h/z4).

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